Download PDFMeasurements on small parts like screws, bolts and nuts
Measurements on contacts and electronic components
Determining of the composition of electroplating baths
Coating thickness measurement gauge for connectors – XULM is available in various technical specifications. These are robust entry-level X-ray fluorescence measuring instruments for non-destructive material analysis and coating thickness measurement. Compact sized these devices are extensively acclaimed for their consistent performance, outstanding accuracy and longer service life. These are widely used for the non-destructive coating thickness measurement and material analysis.
Software Used : WinFTM®
Design Standards : DIN ISO 3497 and ASTM B 568
Measurements on small parts like screws, bolts and nuts
Measurements on contacts and electronic components
Determining of the composition of electroplating baths
Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF)
for material analysis and coating thickness measurement.
Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously with
option WinFTM® BASIC.
Design:Bench top unit with upwards opening hood
Measuring direction:Bottom up
X-ray tube:
XUL 210, XUL 220:Micro-focus tungsten tube with beryllium window
XULM 240:Micro-focus tungsten tube with beryllium window
High voltage:Three steps: 30 kV, 40 kV, 50 kV
Aperture (Collimator):
XUL 210, XUL 220:Ø 0.3 mm (11.8 mils), optional slot Ø 0.3 x 0.05 mm (11.8 x 2 mils)
XULM 240:4 x changeable
Standard (523-440):Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); 0.05 x 0,05 mm (2 x 2 mils);
0.2 x 0.03 mm (7.9 x 1.2 mils)
Optional (523-366):Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); Ø 0.3 mm (11.8 mils);
0.3 x 0.05 (11.8 x 2 mils)
Optional (524-061):Ø 0.1 mm (3.9 mils); Ø 0.2 mm (7.9 mils); 0.3 x 0.05 mm (11.8 x 2 mils);
Primary filter:
XUL 210, XUL 220:fixed
XULM 240:3 x changeable (Standard configuration: Nickel, Aluminum, no filter)
Measurement spot:Depending on the measuring distance and on the aperture, the actual
measurement.Spot size is shown in the video image.
Smallest measurement spot:
XUL 210 and XUL 220: approx. Ø 0,51 mm (20 mils)
XULM 240: approx. Ø 0,1 mm (3.9 mils)
X-ray detector:Proportional counter tube
Absorber:XULM 240 only: optional cobalt or nickel absorber
Measuring distance:0 … 25 mm (0 … 1 in)
Distance compensation with patented DCM method for simplified
measurements at varying distances. For particular applications or for
higher demands on accuracy anadditional calibration might be necessary.
Sample positioning:Manually
Video microscope:High-resolution CCD color camera for optical monitoring of the
measurement location along the primary beam axis, Crosshairs with
a calibrated scale (ruler) and spot-indicator,Adjustable LED illumination.
Zoom factor:Digital 1x, 2x, 3x, 4x
Computer:Windows®-PC
Software:Standard: Fischer WinFTM® LIGHT
Optional: Fischer WinFTM® BASIC, PDM®, SUPER
| Sample Stage | ||
|---|---|---|
| XUL 210 | XUL 220,XULM 240 | |
| Design | Fixed sample support | Manual operable X/Y-stage |
| Usable sample placement area | 310 x 320 mm (12.2 x 12.6 in) | 310 x 320 mm (12.2 x 12.6 in) |
| Maximum travel XY | - | 30 (X) x 40 (Y) mm 1.2 (X) x 1.6 (Y) in |
| Max. sample Weight | 13 kg (29 lb) | 2 kg (4.4 lb) |
| Max. sample Height | 174 mm (6.8 in) | 174 mm (6.8 in) |
Power supply:AC 115 V or AC 230 V 50 / 60 Hz
Power consumption:max. 120 W, without evaluation PC
Protection class:IP40
External dimensions:Width x depth x height [mm]: 403 x 588 x 444 mm (15.9 x 23.2 x 17.5 in)
Weight:Approx. 45 kg (100 lb)
Operating temperature:10 °C – 40 °C / 50 °F – 104 °F
Storage/Transport0 °C – 50 °C / 32 °F – 122 °F
temperature:
Admissible air humidity:≤ 95 %, non-condensing
CE approval:EN 61010
X-Ray standards:DIN ISO 3497 and ASTM B 568
Approval:Fully protected instrument with type approval according to
theGerman regulations "Deutsche Röntgenverordnung-RöV".