Send EMAIL

Logo

Application

Download PDF

X-ray Fluorescence Measuring Instrument : XDLM

Coating thickness gauge for electroplating and electroless coatings XDLM is engineered under the firm direction of experienced quality controllers. These are widely acknowledged as X-ray fluorescence measuring instrument for manual or automated coating thickness measurements and analyses on PC-boards. These are universally applicable energy dispersive X-ray fluorescence measuring instruments and ideal for the measurement and analysis of thin coatings, even at small concentrations.

ask for price
Coating Thickness Gauge For Electroplating and Electroless Coating : XDLM

Software Used : WinFTM®
Design Standards : DIN ISO 3497 and ASTM B 568

Models

XDLM 231: Plane support stage, motor-driven Z-axis

XDLM 232: Manually operable XY-stage, motor-driven Z-axis

XDLM 237: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis

Typical fields of application

Measurement of electroplated mass-produced parts

Inspection of thin coatings, e.g., decorative chromium-plating

Analysis of functional coatings in the electronics and semiconductor industries

Automated measurements, e.g., on printed circuit boards

General Specification

Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to

determine thin coatings, small structures and alloys.


Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously with

option WinFTM® BASIC.


Design:Bench top unit with upwards opening hood


Measuring direction:Top down


X-Ray Source

X-ray tube:Micro-focus tungsten tube with beryllium window


High voltage:Three steps: 30 kV, 40 kV, 50 kV


Aperture (Collimator):4x changeable


Standard (523-440):[mm]: Ø 0.1, Ø 0.2, 0.05 x 0,05, 0.2 x 0.03; [mils]: Ø 3.9, Ø 7.9, 2 x 2, 7.9 x 1.2


Optional (523-366):[mm]: Ø 0.1, Ø 0.2, Ø 0.3, 0.3 x 0.05; [mils]: Ø 3.9, Ø 7.9, Ø 11.8, 11.8 x 2


Optional (524-061):[mm]: Ø 0.1, Ø 0.2, 0.3 x 0.05, 0.05 x 0,05; [mils]: Ø 3.9, Ø 7.9, 11.8 x 2, 2 x 2



Primary filter:3x changeable (Standard configuration: Nickel, Aluminum, no filter)


Measurement spot:Depending on the measuring distance and on the aperture, the actual

measurement.Spot size is shown in the video image.


Smallest measurement spot: approx.


Ø 0.1 mm (3.9 mils) with aperture

0.05 x 0.05 mm (2 x 2 mils)

X-Ray Detection

X-ray detector:Proportional counter tube


Measuring distance:0 … 80 mm (0 … 3.2 in)


Distance compensation with patented DCM method for simplified

measurements at varying distances. For particular applications or for

higher demands on accuracy anadditional calibration might be necessary.


Sample Alignment

Sample positioning:Manually


Video microscope:High-resolution CCD colour camera for optical monitoring of the

measurement locationalong the primary beam axis, manual focusing

and auto-focus,crosshairs with acalibrated scale (ruler) and spot-indicator,

adjustable LED illumination,laser pointer (class 1) to support accurate

sample placement.


Zoom factor:Digital 1x, 2x, 3x, 4x


Evaluation Unit

Computer:Windows®-PC


Software:Standard: Fischer WinFTM® LIGHT

Optional: Fischer WinFTM® BASIC, PDM®, SUPER



Sample support stage

Sample Stage
XDLM 231 XDLM 232 XDLM 237
Design Fixed sample Support Manual XY-stage Programmable XY-stage
Maximum travel XY - 95 x 150 mm (3.7 x 5.9 in) 255 x 235 mm (10 x 9.2 in)
Travel speed XY - - ≤ 80 mm/s (3.1 in/s)
Repeatability precision XY - - ≤ 0,01 mm (0.4 mils)(*1)
Usable sample placement area 463 x 500 mm (18.2 x 19.7 in) 420 x 450 mm (16.5 x 17.7 in) 300 x 350 mm (11.8 x 13.8 in)
Z axis Electrically adjustable Electrically adjustable Programmable
Travel Z axis 140 mm (5.5 in) 140 mm (5.5 in) 140 mm (5.5 in)
Max. sample weight 20 kg (44 lb) 20 kg (44 lb) 5 kg (11 lb) / 20 kg (44 lb)(*2)
Max. sample height 140 mm (5.5 in) 140 mm (5.5 in) 140 mm (5.5 in)

Electrical Data

Power supply:AC 115 V or AC 230 V 50 / 60 Hz


Power consumption:max. 120 W, without evaluation PC


Protection class:IP40


Dimensions

External dimensions:Width x depth x height [mm]: 570 x 760 x 650, [in]: 22 x 30 x 26


Interior dimensionsWidth x depth x height [mm]: 460 x 495 x 146, [in]: 18 x 19.5 x 5.7

measurement chamber:


Weight:XDLM 231: 100 kg/220 lbs; XDLM 232: 108 kg/238 lbs;


XDLM 237: 120 kg/265 lbs


Environmental Conditions

Operating temperature:10 °C – 40 °C / 50 °F – 104 °F


Storage/Transport0 °C – 50 °C / 32 °F – 122 °F

temperature:


Admissible air humidity:≤ 95 %, non-condensing/p>

Standards

CE approval:EN 61010


X-Ray standards:DIN ISO 3497 and ASTM B 568


Approval:Fully protected instrument with type approval according to

theGerman regulations "Deutsche Röntgenverordnung-RöV".


Get An Instant Quote

Looking for Product Name ?

x

Send SMS Enquiry

*Please Enter Requirment

*Please Enter valid Mobile Number

*Please Enter Proper Name