New generation highly precise Gold Analyzer
Advanced top to bottom ED-XRF Machine with high-resolution Silicon Drift Detector ( SDD). The Goldscope SD 600 provides an alll-in-one solutions for precious metal analysis and coating thickness measurement, Multi-Layer Thickness Measurement, Solution Analysis and Alloy composition.
High resolution Silicon Drift Detector with large aperture (Ø3 mm, 118 mils) enables Goldscope SD 600 to achieve highest accuracy with a short measurement time.