Download PDF

Coating Thickness Measurement Gauge For Connectors : XDLM 237

Coating thickness measurement gauge for connectors - XDLM237 is engineered using best available techniques and following international industrial standard. These are X-ray fluorescence measuring instrument for manual or automated coating thickness measurements and analysis on PC-boards, electronics components and mass-produced parts, even on small structures. These are widely used for the measurement and analysis of thin coatings, even at small concentrations. These are acclaimed for its effective usage and longer service life.

ask for price
Coating Thickness Measurement Gauge For Connectors : XDLM 237

XDLM 231: Plane support stage, motor-driven Z-axis

XDLM 232: Manually operable XY-stage, motor-driven Z-axis

XDLM 237: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis

Typical fields of application

Measurement of electroplated mass-produced parts

Inspection of thin coatings, e.g., decorative chromium-plating

Analysis of functional coatings in the electronics and semiconductor industries

Automated measurements, e.g., on printed circuit boards

General Specification

Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF)

to determine thin coatings and alloys.

Element range:Aluminum Al (13) to Uranium U (92) – up to 24 elements simultaneously.

Design:Bench-top unit with hood opening upwards

XY-stage and Z-axis electrically driven and programmable

Motor-driven changeable apertures and filters

Video camera and laser pointer (class 1) for orienting the sample

Measuring direction:Top down

X-Ray Source

X-ray tube:Micro focus tungsten tube with beryllium window

High voltage:Three steps 10 kV, 30 kV, 50 kV

Aperture (Collimator):4x changeable: Ø 0.1 mm (3.9 mils), Ø 0.3 mm (11.8 mils), Ø 0.6 mm

(23.6 mils) slot 0.5 x 0.15 mm (19.7 x 5.9 mils), others on request

Primary filter:3x changeable (Standard configuration: Nickel, Aluminum, no filter)

Measurement spot:Depending on the measuring distance and on the aperture, the actual

measurement spot size is shown in the video image. Smallest measurement

approx. Ø 0.15 mm (5.9 mils) with aperture 0.1 mm (3.9 mils)

X-Ray Detection

X-ray detector:Silicon PIN detector with peltier cooling

Resolution (fwhm for Mn-Kα):≤ 200 eV

Measurement distance:0 … 80 mm (0 … 3.2 in) Distance compensation with patented DCM method

for simplified measurements at varying distances. For particular applications

or for higher demands on accuracy an additional calibration might be


Sample Alignment

Video microscope:High-resolution CCD color camera for optical monitoring of the

measurement location along the primary beam axis,manual focusing

and auto-focus, crosshairs with a calibrated scale (ruler) and spot-

indicator,adjustable LED illumination, laser pointer (class 1)

to support accurate sample placement.

Zoom factor:Digital 1x, 2x, 3x, 4x

Sample Stage

Design: Programmable, motor-driven XY-stage

Maximum travel: X/Y-axis: 255 x 235 mm (10 x 9 in); Z-axis: 140 mm (5 in)

Max. travel speed: 80 mm/s (3.2 in/s)

Repeatability precision XY: ≤ 0.01 mm (0.4 mils), unidirectional

Usable sample Width x depth [mm]: 300 x 350 mm, [in]: 12 x 14

placement area:

Max. sample weight: 5 kg, with reduced approach travel precision 20 kg

Max. sample height: 140 mm (5.5 in)

Electrical Data

Power supply:AC 115 V or AC 230 V 50 / 60 Hz

Power consumption:Max. 120 W ,without evaluation PC

Protection class:IP40


External dimensions
Width x depth x height [mm]:
570 x 760 x 650 mm, [in]: 22 x 30 x 26

Interior dimensions460 x 495 x 146 mm, [in]: 18 x 19.5 x 5.7

Width x depth x height [mm]:
measurement chamber

Weight:Approx. 115 kg (52 lb)

Environmental Conditions

Temperature: Operation:10 °C – 40 °C / 50 °F – 104 °F

Temperature0 °C – 50 °C / 32 °F – 122 °F


Admissible air humidity:≤ 95 %, non-condensing

Evaluation Unit


Software:Standard: Fischer WinFTM® BASIC including PDM®,

Optional: Fischer WinFTM® SUPER


CE approval:EN 61010

X-Ray standards:DIN ISO 3497 and ASTM B 568

Approval:Fully protected instrument with type approval according to the German

regulations "Deutsche Röntgenverordnung-RöV".

Get An Instant Quote

Looking for Product Name ?


Send SMS Enquiry

*Please Enter Requirment

*Please Enter valid Mobile Number

*Please Enter Proper Name