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Coating Thickness Gauge For Electroplating and Electroless Coating : XDL

Coating thickness gauge for electroplating and electroless coatings XDL is an X-ray fluorescence measuring instrument for manual or automated coating thickness measurements on protective and decorative coatings. These are extensively acknowledged as a universally applicable energy dispersive X-ray measuring instruments which are widely used for non-destructive thickness measurements and analysis of thin coatings, for measurements on mass-produced parts and printed circuit boards as well as for the solution analysis. These are engineered under the firm direction of experienced quality controllers and following international industrial standard.

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Coating Thickness Gauge For Electroplating and Electroless Coating : XDL
Models

XDL 210: Plane support stage, fixed Z-axis

XDL 220: Plane support stage, motor-driven Z-axis

XDL 230: Manually operable XY-stage, motor-driven Z-axis

XDL 240: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis

Typical fields of application

Measurement of electroplated mass-produced parts

Inspection of thin coatings, e.g., decorative chromium-plating

Analysis of functional coatings in the electronics and semiconductor industries

Automated measurements, e.g., on printed circuit boards

Solution analysis in the electroplating

General Specification

Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to

determine thin coatings and for the solution analysis.


Element range:Chlorine (17) to Uranium (92) – up to 24 elements simultaneously with

option WinFTM® BASIC.


Design:Bench top unit with upwards opening hood


Measuring direction:Top down


X-Ray Source

X-ray tube:Tungsten tube with beryllium window


High voltage:Three steps: 30 kV, 40 kV, 50 kV


Aperture (Collimator):Ø 0.3 mm (11.8 mils), Optional: Ø 0.1 mm (3.9 mils), Ø 0.2 mm (7.9 mils),

slot 0.3 x 0.05 mm (11.8 x 2 mils)


Measurement spot:Depending on the measuring distance and on the aperture, the actual

measurement.Spot size is shown in the video image.


Smallest measurement spot: approx.


Ø 0.2 mm (7.9 mils)


X-Ray Detection

X-ray detector:Proportional counter tube


Measuring distance:0 … 80 mm (0 … 3.2 in)


Distance compensation with patented DCM method for simplified

measurements at varying distances. For particular applications or for

higher demands on accuracy anadditional calibration might be necessary.


Sample Alignment

Sample positioning:Manually


Video microscope:High-resolution CCD color camera for optical monitoring of the

measurement location along the primary beam axis,Crosshairs with a

calibrated scale (ruler) and spot-indicator,Adjustable LED illumination


Zoom factor:Digital 1x, 2x, 3x, 4x


Evaluation Unit

Computer:Windows®-PC


Software:Standard: Fischer WinFTM® LIGHT

Optional: Fischer WinFTM® BASIC, PDM®, SUPER



Sample support stage

Sample Stage
XDL 210 XDL 220 XDL 230 XDL 240
Design Fixed sample Support Fixed sample Support Manual XY-stage Programmable XY-stage
Maximum travel XY - - 95 x 150 mm (3.7 x 5.9 in) 255 x 235 mm (10 x 9.2 in)
Travel speed XY - - - ≤ 80 mm/s (3.1 in/s)
Repeatability precision XY - - - ≤ 0,01 mm (0.4 mils)(*1)
Usable sample placement area 463 x 500 mm (18.2 x 19.7 in) 463 x 500 mm (18.2 x 19.7 in) 420 x 450 mm (16.5 x 17.7 in) 300 x 350 mm (11.8 x 13.8 in)
Z axis Fixed Position (Top/Middle/Bottom) Electrically adjustable Electrically adjustable Programmable
Travel Z axis - 140 mm (5.5 in) 140 mm (5.5 in) 140 mm (5.5 in)
Max. sample weight 20 kg (44 lb) 20 kg (44 lb) 20 kg (44 lb) 5 kg (11 lb) / 20 kg (44 lb)(*2)
Max. sample height 155/90/25 mm (6/3.5/1 in) 140 mm (5.5 in) 140 mm (5.5 in) 140 mm (5.5 in)
Laser pointer (class 1) to
support accurate sample placement
- - Yes Yes

Electrical Data

Power supply:AC 115 V or AC 230 V 50 / 60 Hz


Power consumption:max. 120 W, without evaluation PC


Protection class:IP40


Dimensions

External dimensions:Width x depth x height [mm]: 570 x 760 x 650 mm, [in]: 22 x 30 x 26


Interior dimensions:Width x depth x height [mm]: 460 x 495 x see max. sample height

measurement:


chamber:[in]: 18 x 19.5 x 26 x see max. sample height


Weight:XDL 210: 94 kg (207 lb); XDL 220: 99 kg (218 lb); XDL 230: 107 kg (235 lb);


XDL 240: 120 kg (264 lb)


Environmental Conditions

Operating temperature:10 °C – 40 °C / 50 °F – 104 °F


Storage/Transport0 °C – 50 °C / 32 °F – 122 °F

temperature:


Admissible air humidity:≤ 95 %, non-condensing


Standards

CE approval:EN 61010


X-Ray standards:DIN ISO 3497 and ASTM B 568


Approval:Fully protected instrument with type approval according to

theGerman regulations "Deutsche Röntgenverordnung-RöV".


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