These are user-friendly bench-top instruments available in various housing size and support stage.
These are extensively recommended by clients owing to its quick and easy sample positioning.
These are available in different range including XAN 220 and XAN 222, which are fitted with small parts and for quick and easy sample positioning.
The X-ray source and semiconductor detector assembly is located in the instrument‘s lower chamber.
These are straightened with the integrated video microscope with zoom and crosshairs simplifies sample placement and allows precise measuring spot adjustment.
These are operated through the powerful and user-friendly WinFTM® software.
The FISCHERSCOPE X-RAY XAN 220 is designed as per DIN ISO 3497 and XAN 222 fulfill ASTM B 568 standard.