These are widely known as a user-friendly bench-top instrument with quick and easy specimen positioning.
These are designed in such a way that its X-ray source and semiconductor detector assembly is located in the instrument‘s lower chamber, which ensure that the measuring direction is from underneath the sample, which is supported by a transparent window.
These provide precise measuring spot adjustment as these are fitted with the integrated video-microscope with zoom and crosshairs simplifies sample place.
Our machines are directed through powerful and user-friendly WinFTM® software for the entire operation and evaluation of measurements as well as the clear presentation.
Our devices are Fully protected instrument with type approval according to the German regulations „Deutsche Röntgenverordnung-röv“ and designed as per DIN ISO 3497 and ASTM B 568 standard.